Armms RF and Microwave Society
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Conferences

Monday 28th October to Tuesday 29th October 2002 at Tortworth Hotel,

VENUE

Tortworth Hotel
Tortworth
South Gloucestershire


PROGRAMME CO-ORDINATOR

David Adamson
NPL
Teddington


PAPERS

A VERSATILE 77 GHZ SCANNING RADAR SYSTEM

D G Spencer*, G .Clark**, M.Hobden*
*Dynex Semiconductor Ltd, ** Navtech Electronics Ltd.
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A VERSATILE 77 GHZ SCANNING RADAR SYSTEM

ACCURATE POWER MEASUREMENTS ON MODERN COMMUNICATION SYSTEMS

Guy Purchon
Anritsu
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ACCURATE POWER MEASUREMENTS ON MODERN COMMUNICATION SYSTEMS

ELECTROMAGNETIC MATERIALS MEASUREMENTS FOR RF AND MICROWAVE METROLOGY

R N Clarke
NPL
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ELECTROMAGNETIC MATERIALS MEASUREMENTS FOR RF AND MICROWAVE METROLOGY

End of Line RF and Microwave PCM Testing of 6inch GaAs pHEMT Wafers

Nigel Cameron
Filtronic Compound Semiconductors Ltd
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End of Line RF and Microwave PCM Testing of 6inch GaAs pHEMT Wafers

i QUASI-OPTA QUASI OPTICAL MICROWAVE FOCUSED & EBAM SYSTEM FOR MATERIALS MEASUREMENT

Les Hill
BAE SYSTEMS
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i QUASI-OPTA QUASI OPTICAL MICROWAVE FOCUSED & EBAM SYSTEM FOR MATERIALS MEASUREMENT

IMPROVEMENTS TO THE DETECTION AND ELIMINATION OF LEAKAGE IN THE NATIONAL ATTENUATION MEASUREMENT FACILITY

K P Holland, J Howes and C Purser
NPL
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IMPROVEMENTS TO THE DETECTION AND ELIMINATION OF LEAKAGE IN THE NATIONAL ATTENUATION MEASUREMENT FACILITY

INTERCOMPARISON OF QUASI-OPTICAL AND WAVEGUIDE TECHNIQUES FOR THE MEASUREMENT OF THE COMPLEX DIELECTRIC CONSTANTS OF SOLID MATERIALS

Robert I. HUNTER, Duncan A. ROBERTSON and James C.G. LESURF
University of St Andrews
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INTERCOMPARISON OF QUASI-OPTICAL AND WAVEGUIDE TECHNIQUES FOR THE MEASUREMENT OF THE COMPLEX DIELECTRIC CONSTANTS OF SOLID MATERIALS

MEASUREMENTS of RF Voltage

Alan J Coster
Dowding & Mills Calibration
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MEASUREMENTS of RF Voltage

Performance Measurements of 3G Systems Using a Radio Channel Simulator

Jari -Heinanen
Elektrorbit Ltd
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Performance Measurements of 3G Systems Using a Radio Channel Simulator

Pitfalls of RF Testing from a Bluetooth Angle

Halam Rose
7 Layers
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Pitfalls of RF Testing from a Bluetooth Angle

Pitfalls of RF Testing from a Bluetooth Angle

Halam Rose
7 Layers
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Pitfalls of RF Testing from a Bluetooth Angle

Power Amplifier devices for UMTS

A D Vare, R Hopper
Roke Manor Research
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Power Amplifier devices for UMTS

Techniques for Right First Time MMIC Design

W.H.A. Tang
QinetiQ
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Techniques for Right First Time MMIC Design

The 2003 - 2006 Electrical Programme

David Adamson and Bob Clarke
National Physical Laboratory (NPL)
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The 2003 - 2006 Electrical Programme

The Challenges of RF Measurements in a Bluetooth Frequency Hopping System

Mike Kowalczuk and Graham Howe
Anritsu
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The Challenges of RF Measurements in a Bluetooth Frequency Hopping System

USING A VECTOR NETWORK ANALYSER IN OSCILLATOR DESIGN

Nick Long
Great Circle Design
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USING A VECTOR NETWORK ANALYSER IN OSCILLATOR DESIGN

USING A VECTOR NETWORK ANALYSER IN OSCILLATOR DESIGN

Nick Long
Great Circle Design
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USING A VECTOR NETWORK ANALYSER IN OSCILLATOR DESIGN

Using CAD for RF Architecture Engineering and Optimization

Arden VanDyke
-
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Using CAD for RF Architecture Engineering and Optimization

Using Statistical Process Control to Improve Yield and Traceability for Automated Production Test

S. Hughes, K. Larnond, J Mackay
Agilent Technologies
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Using Statistical Process Control to Improve Yield and Traceability for Automated Production Test


CALL FOR PAPERS

Contributions are invited with an emphasis on RF and microwave design, research, testing and associated subjects. An oral presentation will be made at the meeting and a written paper will be required for publication in the society digest, which is distributed to delegates at the meeting. Prospective speakers are requested to submit a title and a short abstract to the technical coordinator (see above) as soon as possible.

Click here to view our Guidelines for Authors
Click here to view our Publication Release Form

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